Deng J. Metrics for Performance Benchmarking of Nanoscale Si and Carbon Nanotube FETs Including Device Nonidealities [Електронний ресурс] / J. Deng, H.-S. P. Wong // IEEE Transactions on Electron Devices. – 2006. – № 6. – P. 1317–1322
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Статистика використання: Завантажень: 2
Анотація:
This paper proposes a simple and accurate expression for inverter effective drive current for nanoscale Si and carbon nanotube FET (CNFET) performance benchmarking. The proposed metric indicates that the performance enhancement of CNFETs over Si MOSFETs is not as large as that predicted by IDsat in a circuit environment because of the nonideal I–V characteristics.